Observation of the Berreman effect in infrared reflection-absorption spectra of amorphous titanium oxide thin films deposited on aluminum

Applied Spectroscopy

Volumn 54, Issue 5, 2000, Pages 687-691

  Trasferetti, B C ^a   Davanzo, C U ^a   Da Cruz, N C ^a   De Moraes, M A B ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; AMORPHOUS FILMS; COMPUTER SIMULATION; INFRARED SPECTROSCOPY; LIGHT POLARIZATION; LIGHT REFLECTION; OPTICAL PROPERTIES; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SPECTROSCOPIC ANALYSIS; THIN FILMS; TITANIUM OXIDES;

BERREMAN EFFECT; FRESNEL EQUATION; INFRARED REFLECTION ABSORPTION SPECTRA; KRAMERS-KRONIG ANALYSIS;

ABSORPTION SPECTROSCOPY;

EID: 0033687327     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702001949933     Document Type: Article

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