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Scripta Materialia

Volumn 46, Issue 3, 2002, Pages 247-251

Electromigration-induced via failure assisted by neighboring clusters

(3) Choi, In Suk a Park, Young Joon b Joo, Young Chang a

a Seoul National University (South Korea)

b Korea Institute of Science and Technology (South Korea)

Author keywords

Computer simulation; Electromigration; Interconnects

Indexed keywords

COMPUTER SIMULATION; CURRENT DENSITY; FAILURE (MECHANICAL); GRANULAR MATERIALS; STRESS ANALYSIS;

POLYGRANULAR CLUSTERS;

ELECTROMIGRATION;

EID: 0036466892 PISSN: 13596462 EISSN: None Source Type: Journal
DOI: 10.1016/S1359-6462(01)01235-0 Document Type: Article

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.