Dedicated autonomous scan-based testing (DAST) for embedded cores

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 1176-1183

  Nahvi, Mohsen ^a   Ivanov, André ^a   Saleh, Resve ^a  

^a UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; BENCHMARKING; DATA REDUCTION; DIGITAL INTEGRATED CIRCUITS; EMBEDDED SYSTEMS; MICROPROCESSOR CHIPS; RESOURCE ALLOCATION; SCANNING; SEQUENTIAL CIRCUITS;

AUTOMATIC TEST EQUIPMENT; DEDICATED AUTONOMOUS SCAN BASED TESTING; EMBEDDED AUTONOMOUS SEQUENCERS; EMBEDDED DIGITAL CORE TESTING; SYSTEM ON CHIPS; TEST DATA COMMUNICATION; TEST DATA CONTROL; TEST DATA OBSERVATION;

BUILT-IN SELF TEST;

EID: 0036446466     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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