New paradigm for signal paths in ATE pin electronics are needed for serialcom device testing

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 903-912

  Shimanouchi, Masashi ^a  

^a SCHLUMBERGER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; AUTOMATIC TESTING; BANDWIDTH; COMPUTER SIMULATION; DATA COMMUNICATION EQUIPMENT; DATA STRUCTURES; DIGITAL FILTERS; EQUIVALENT CIRCUITS; LINEAR SYSTEMS; SIGNAL PROCESSING; TIMING JITTER; TRANSFER FUNCTIONS;

AUTOMATIC TEST EQUIPMENT; JITTER TESTING; PIN ELECTRONICS; SERIALCOM DEVICE TESTING; SIGNAL PATH;

ELECTRON DEVICE TESTING;

EID: 0036443154     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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