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Volumn , Issue , 2001, Pages 502-511
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Test challenges for SONET/SDH physical layer OC3 devices and beyond
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Author keywords
[No Author keywords available]
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Indexed keywords
BIT ERROR RATE;
DATA TRANSFER;
JITTER;
LIGHT MODULATORS;
LIGHT TRANSMISSION;
TRANSCEIVERS;
AUTOMATIC TEST EQUIPMENTS (ATE);
OPTICAL DEVICES;
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EID: 0035687175
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (9)
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References (9)
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