Pin electronics IC for high speed differential devices

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 1128-1133

  Oshima, Atsushi ^a   Poniatowski, John ^a   Nomura, Toshihiro ^a  

^a SCHLUMBERGER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPARATOR CIRCUITS; ELECTRONIC EQUIPMENT TESTING; RESISTORS;

HIGH SPEED DIFFERENTIAL DEVICES;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0035684102     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. A 600MHz Si bipolar pin electronics IC with timing error less than 25ps