Evaluation of crystalline germanium thin films electrodeposited on copper substrates from propylene glycol electrolyte

Surface and Coatings Technology

Volumn 162, Issue 1, 2003, Pages 101-105

  Saitou, M ^a   Sakae, K ^a   Oshikawa, W ^a  

^a UNIVERSITY OF THE RYUKYUS   (Japan)

Author keywords

Atomic force microscopy; Electroplating; Germanium; Infrared spectroscopy; Roughness; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRODEPOSITION; ELECTROLYTES; GERMANIUM; HYDROGEN BONDS; INFRARED SPECTROSCOPY; PHASE TRANSITIONS; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

SURFACE GROWTH MODELS;

COATINGS;

COPPER; ELECTRODEPOSITION; GERMANIUM;

EID: 0036409359     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(02)00576-5     Document Type: Article

References (18)