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Volumn , Issue , 2002, Pages 131-136
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Understanding and addressing the impact of wiring congestion during technology mapping
a a a |
Author keywords
Algorithms; Design; Performance
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Indexed keywords
ELECTRIC WIRING;
INTEGRATED CIRCUIT LAYOUT;
LOGIC GATES;
OPTIMIZATION;
ROUTERS;
TECHNOLOGY MAPPING;
COMPUTER AIDED LOGIC DESIGN;
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EID: 0036375850
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1145/505418.505421 Document Type: Conference Paper |
Times cited : (9)
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References (16)
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