Leakage current in low standby power and high performance devices: Trends and challenges

Proceedings of the International Symposium on Physical Design

Volumn , Issue , 2002, Pages 22-27

  Yeap, Geoffrey C F ^a  

^a MOTOROLA INC   (United States)

Author keywords

CMOS technology; Gate tunneling leakage; High performance; Leakage current; Low standby power; Off state sub threshold leakage; System on a ship (SoC)

Indexed keywords

CMOS INTEGRATED CIRCUITS; MOSFET DEVICES; SIGNAL PROCESSING; STANDBY POWER SYSTEMS;

DRAIN JUNCTION LEAKAGE CURRENT;

LEAKAGE CURRENTS;

EID: 0036375848     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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