메뉴 건너뛰기




Volumn 91, Issue 1-4, 2002, Pages 89-96

Mapping and control of atomic force on Si(111)√3×√3-Ag surface using noncontact atomic force microscope

Author keywords

Atomic force spectroscopy; Control of atomic force; Force mapping; Noncontact; True atomic resolution

Indexed keywords

ATOMS; MAPPING; SILICON COMPOUNDS; SILVER;

EID: 0036326023     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00086-4     Document Type: Article
Times cited : (2)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.