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Volumn 91, Issue 1-4, 2002, Pages 89-96
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Mapping and control of atomic force on Si(111)√3×√3-Ag surface using noncontact atomic force microscope
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Author keywords
Atomic force spectroscopy; Control of atomic force; Force mapping; Noncontact; True atomic resolution
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Indexed keywords
ATOMS;
MAPPING;
SILICON COMPOUNDS;
SILVER;
ATOMIC SCALE;
ATOMIC FORCE MICROSCOPY;
SILICON;
SILVER;
ARTICLE;
ATOM;
ATOMIC FORCE MICROSCOPY;
ATOMIC PARTICLE;
CHEMICAL INTERACTION;
FORCE;
SAMPLE;
THREE DIMENSIONAL IMAGING;
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EID: 0036326023
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-3991(02)00086-4 Document Type: Article |
Times cited : (2)
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References (21)
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