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Volumn 317, Issue 3, 2002, Pages 375-384
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Multi-resolution contour-based fitting of macromolecular structures
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Author keywords
Docking; Electron microscopy; Low resolution; Macromolecular models; Structure modeling
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Indexed keywords
ACCURACY;
ALGORITHM;
ALPHA CHAIN;
ARTICLE;
ATOMIC PARTICLE;
BETA CHAIN;
ELECTRON MICROSCOPY;
FILTER;
FOURIER TRANSFORMATION;
IMAGE RECONSTRUCTION;
MACROMOLECULE;
MICROTUBULE;
MOLECULAR MODEL;
MOLECULAR PROBE;
MOLECULAR SIZE;
OPTICAL RESOLUTION;
PRIORITY JOURNAL;
QUANTITATIVE ANALYSIS;
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EID: 0036297629
PISSN: 00222836
EISSN: None
Source Type: Journal
DOI: 10.1006/jmbi.2002.5438 Document Type: Article |
Times cited : (298)
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References (46)
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