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Volumn 496, Issue 1-2, 2002, Pages 97-109

Structure of thin aluminium-oxide films determined from valence band spectra measured using XPS

(3) Snijders, P C a Jeurgens, L P H a Sloof, W G a

a DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

Aluminum; Aluminum oxide; Amorphous thin films; Crystallization; Insulating films; Oxidation; Scanning transmission electron microscopy (STEM); X ray photoelectron spectroscopy

Indexed keywords

ALUMINUM COMPOUNDS; AMORPHOUS FILMS; CRYSTALLIZATION; FILM GROWTH; SCANNING TUNNELING MICROSCOPY; THERMOOXIDATION; X RAY PHOTOELECTRON SPECTROSCOPY;

VALENCE BAND SPECTRA;

THIN FILMS;

EID: 0036132821 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)01591-6 Document Type: Article

Times cited : (97)

References (42)

1
- 0344462722
- (1999) Science , vol.286 , pp. 507
- De Teresa, J.M.¹ Barthélémy, A.² Fert, A.³ Contour, J.P.⁴ Montaigne, F.⁵ Seneor, P.⁶

2
- 18144441119
- (1999) Phys. Rev. Lett. , vol.82 , pp. 616
- Sharma, M.¹ Wang, S.X.² Nickel, J.H.³

3
- 0000432842
- (2000) J. Appl. Phys. , vol.88 , pp. 2805
- Hickmott, T.W.¹

4
- 0002758993
- (1998) Semicond. Sci. Technol. , vol.13
- Snow, E.S.¹ Campbell, P.M.² Rendell, R.W.³ Buaot, F.A.⁴ Park, D.⁵ Marrian, C.R.K.⁶ Magno, R.⁷

5
- 0001060125
- (2000) Appl. Phys. Lett. , vol.77 , pp. 815
- Van Gogh, A.T.M.¹ Van der Molen, S.J.² Kerssemakers, J.W.J.³ Koeman, N.J.⁴ Griessen, R.⁵

6
- 0000922626
- (1999) J. Vac. Sci. Technol. A , vol.17 , pp. 1727
- Zhukov, Z.¹ Popova, I.² Yates, J.T.³

7
- 0001195630
- (2000) J. Appl. Phys. , vol.87 , pp. 8143
- Popova, I.¹ Zhukov, Z.² Yates, J.T.³

8
- 0001171551
- (1999) Phys. Rev. B , vol.59
- Jennison, D.R.¹ Verdozzi, C.² Schultz, P.A.³ Sears, M.P.⁴

9
- 4243219492
- (1999) Phys. Rev. Lett. , vol.82 , pp. 4050
- Bogicevic, A.¹ Jennison, D.R.²

10
- 0000778775
- (2000) Phys. Rev. B , vol.62 , pp. 4707
- Jeurgens, L.P.H.¹ Sloof, W.G.² Tichelaar, F.D.³ Mittemeijer, E.J.⁴

11
- 0018048821
- (1978) J. Non-Cryst. Solids , vol.31 , pp. 81
- Brodsky, M.H.¹ Cardona, M.²

12
- 0003746901
- Auger, EELS, and LEED, Ph.D. Thesis, Cornell University, Ithaca, New York
- (1984) Characterization of the electronic and geometric structures of aluminas using XPS
- Kao, C.-C.¹

13
- 0001007217
- (1975) J. Phys. Chem. Solids , vol.36 , pp. 1273
- Tossel, J.A.¹

14
- 33847802122
- (1975) J. Am. Chem. Soc. , vol.97 , pp. 4840
- Tossel, J.A.¹

15
- 0003427392
- D. Briggs (Ed.), Heyden & Son, London
- (1977) Handbook of X-ray and Ultraviolet Photoelectron Spectroscopy , pp. 48-52
- Orchard, A.F.¹

16
- 0032662610
- (1999) Appl. Surf. Sci. , vol.144-145 , pp. 11
- Jeurgens, L.P.H.¹ Sloof, W.G.² Tichelaar, F.D.³ Borsboom, C.G.⁴ Mittemeijer, E.J.⁵

17
- 0006946069
- submitted for publication
- Jeurgens, L.P.H.¹ Sloof, W.G.² Tichelaar, F.D.³ Mittemeijer, E.J.⁴

18
- 0034227889
- (2000) Appl. Surf. Sci. , vol.161 , pp. 139
- Jeurgens, L.P.H.¹ Sloof, W.G.² Borsboom, C.G.³ Tichelaar, F.D.⁴ Mittemeijer, E.J.⁵

19
- 36449000650
- (1993) J. Chem. Phys. , vol.99 , pp. 2128
- Brune, H.¹ Wintterlin, J.² Trost, J.³ Ertl, G.⁴ Wiechers, J.⁵ Behm, R.J.⁶

20
- 0001703651
- (1967) J. Phys. Chem. Solids , vol.28 , pp. 2155
- Jona, F.¹

21
- 0006898312
- D. Briggs, M.P. Seah (Eds.), second ed., Wiley, Chichester
- (1990) Practical Surface Analysis , vol.1 , pp. 229
- Seah, M.P.¹

22
- 0003459529
- (1992) Handbook of X-ray Photoelectron Spectroscopy , pp. 18
- Moulder, J.F.¹ Stickle, W.F.² Sobol, P.E.³ Bomben, K.D.⁴

23
- 0006971256
- Eden Pairie, USA
- Perkin-Elmer Physical Electronics Division
- Chastian, J.¹

24
- 0006935682
- (1978) Surf. Sci. , vol.72 , pp. 495
- Baird, R.J.¹ Fadley, C.S.² Goldberg, S.M.³ Feibelman, P.J.⁴ Šunjić, M.⁵

25
- 0024029261
- (1988) Surf. Interf. Anal. , vol.11 , pp. 453
- Tougaard, S.¹

26
- 0023308369
- (1987) Solid State Commun. , vol.61 , pp. 547
- Tougaard, S.¹

27
- 0004091959
- Wiley, New York
- (1991) Factor Analysis in Chemistry, second ed.
- Malinowski, E.R.¹ Howery, D.G.²

28
- 0001604954
- (1974) Phys. Rev. B , vol.9 , pp. 3573
- Kowalczyk, S.P.¹ McFeely, F.R.² Ley, L.³ Pollak, R.A.⁴ Shirley, D.A.⁵

29
- 0026413924
- (1991) Surf. Sci. , vol.250 , pp. 71
- Gautier, M.¹ Duraud, J.P.² Van, L.P.³ Guittet, M.J.⁴

30
- 0030871525
- (1997) Surf. Interf. Anal. , vol.25 , pp. 5
- Schöpke, A.¹ Kelling, S.²

31
- 0000134014
- (1976) Phys. Rev. Lett. , vol.37 , pp. 1282
- Flodstrom, S.A.¹ Bachrach, R.Z.² Bauer, R.S.³ Hagström, S.B.M.⁴

32
- 0000068472
- (1977) Phys. Rev. B , vol.16 , pp. 1480
- Bradshaw, A.M.¹ Domcke, W.² Cederbaum, L.S.³

33
- 0006989209
- (1968) Phys. Rev. , vol.165 , pp. 1067
- Swanson, N.¹

34
- 0000463594
- (1985) Phys. Rev. B , vol.32 , pp. 1237
- Gignac, W.J.¹ Williams, R.S.² Kowalczyk, S.P.³

35
- 0000589015
- (1983) Phys. Rev. B , vol.28 , pp. 982
- Ciraci, S.¹ Batra, I.P.²

36
- 0000650625
- (1979) Phys. Rev. B , vol.19 , pp. 2837
- Bianconi, A.¹ Bachrach, R.Z.² Hagstrom, S.B.M.³ Flodström, S.A.⁴

37
- 0017269469
- (1976) Phys. Status Solid B , vol.76 , pp. 689
- Balzarotti, A.¹ Bianconi, A.²

38
- 0028516419
- (1994) Thin Solid Films , vol.250 , pp. 92
- Ealet, B.¹ Elyakhloufi, M.H.² Gillet, E.³ Ricci, M.⁴

39
- 85116864004
- (1998) Surf. Sci. Spectra , vol.5 , pp. 18
- Rotole, J.A.¹ Sherwood, P.M.A.²

40
- 0006973819
- (1985) Phys. Rev. B , vol.32 , pp. 8278
- Gupta, R.P.¹

41
- 0000878376
- (1998) Phys. Rev. B , vol.57 , pp. 15219
- Mo, S.D.¹ Ching, W.Y.²

42
- 0006973820
- The MathWorks Inc., Natick
- (1998) MATLAB version 5.2.1.1420

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