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Volumn , Issue , 1996, Pages 99-104
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FRAM - the ultimate memory
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITORS;
CMOS INTEGRATED CIRCUITS;
ELECTRIC BREAKDOWN;
ELECTRIC CURRENT MEASUREMENT;
ELECTRIC FIELD EFFECTS;
FERROELECTRIC DEVICES;
FERROELECTRIC MATERIALS;
FERROELECTRICITY;
LEAD COMPOUNDS;
LEAKAGE CURRENTS;
SEMICONDUCTOR STORAGE;
THIN FILMS;
FERROELECTRIC CRYSTALS;
FERROELECTRIC RANDOM ACCESS STORAGE;
FERROELECTRIC THIN FILMS;
LEAD ZIRCONATE TITANATE;
RANDOM ACCESS STORAGE;
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EID: 0029705266
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (16)
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References (0)
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