Activated transport and scaling behavior in the current-voltage characteristics and Coulomb-blockade oscillations of two-dimensional arrays of metallic islands

Physical Review B - Condensed Matter and Materials Physics

Volumn 57, Issue 12, 1998, Pages R6842-R6845

  Kurdak, C ^a   Rimberg, A ^a   Ho, T ^a   Clarke, John ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000205037     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.R6842     Document Type: Article

References (15)

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12. The specific capacitance of similar sized junctions quoted by various groups are inconsistent with each other and vary from 45 to (Formula presented) [Refs. 5; see also P. Delsing, T. Claeson, K. K. Likharev, and L. S. Kuzmin, Phys. Rev. B 42, 7439 (1990) and
13. L. J. Geerligs et. al Phys. Rev. Lett. 63, 326 (1989)]. In most cases, the junction capacitance (Formula presented) is determined from the offset voltage in the (Formula presented) characteristics and then the specific capacitance is inferred from the estimated areas of the junctions.
14. There exist two formulas, the so-called local and global rules, which relate the offset voltage to (Formula presented) [U. Geigenmuller and G. Schon, Europhys. Lett. 10, 765 (1989) and
15. G. S. Bakhvalov, G. S. Kazacha, K. K. Likharev, and S. I. Serdyukova, Physica B 173, 319 (1991)]. Depending on which rule they use, different groups quote quite different values of (Formula presented) we believe that the global rule yields the correct value.