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Solid State Communications

Volumn 118, Issue 4, 2001, Pages 203-206

The effect of mound roughness on the electrical capacitance of a thin insulating film

(2) Palasantzas, G a De Hosson, J Th M a

a UNIVERSITY OF GRONINGEN (Netherlands)

Author keywords

A. Insulators; A. Surfaces and interfaces; A. Thin films

Indexed keywords

CAPACITANCE MEASUREMENT; INTERFACES (MATERIALS); OPTICAL CORRELATION; PRECISION ENGINEERING; SURFACE ROUGHNESS; THIN FILMS;

MOUND ROUGHNESS; THIN INSULATING FILMS;

INSULATING MATERIALS;

EID: 0035942410 PISSN: 00381098 EISSN: None Source Type: Journal
DOI: 10.1016/S0038-1098(01)00057-6 Document Type: Article

Times cited : (17)

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