Roughness effects on the electrostatic-image potential near a dielectric interface

Journal of Applied Physics

Volumn 82, Issue 1, 1997, Pages 351-355

  Palasantzas, George ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; EFFECTS; ELECTRIC CHARGE; ELECTRIC PROPERTIES; ELECTROSTATICS; FRACTALS; INTERFACES (MATERIALS); PERTURBATION TECHNIQUES;

DIELECTRIC VACUUM INTERFACE; ELECTROSTATIC IMAGE POTENTIAL;

SURFACE ROUGHNESS;

EID: 0031189738     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365820     Document Type: Article

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