Nanoscale fracture studies using the scanning force microscope

Applied Physics Letters

Volumn 78, Issue 17, 2001, Pages 2485-2487

  Baumeister, Bettina ^a   Jung, Thomas A ^a   Meyer, Ernst ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035938326     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1367297     Document Type: Article

References (19)

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