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Volumn 82, Issue 7, 1999, Pages 1490-1493
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Quantitative determination of dislocation-induced strain at the surface of (001) silicon-on-insulator
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000014728
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.82.1490 Document Type: Article |
Times cited : (23)
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References (17)
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