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Volumn 34, Issue 18, 2001, Pages 2792-2797

Minimization of dry etch damage in III-V semiconductors

Author keywords

[No Author keywords available]

Indexed keywords

DRY ETCHING; HETEROJUNCTIONS; INTERFEROMETRY; PHOTOLUMINESCENCE; PLASMA ETCHING; SEMICONDUCTOR QUANTUM WELLS;

EID: 0035929067     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/18/312     Document Type: Article
Times cited : (7)

References (22)
  • 18
    • 0003229489 scopus 로고
    • PhD Thesis University of Glasgow, unpublished
    • (1994)
    • Murad, S.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.