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Volumn 181, Issue 3-4, 2001, Pages 331-338
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The effect of postdeposition annealing on chemical bonding in amorphous carbon nitride films prepared by dc magnetron sputtering
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Author keywords
Carbon nitride; Thermal annealing; XPS
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CARBON NITRIDE;
CHEMICAL BONDS;
DEPOSITION;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
MAGNETRON SPUTTERING;
MORPHOLOGY;
TEXTURES;
X RAY PHOTOELECTRON SPECTROSCOPY;
AMORPHOUS CARBON NITRIDE FILMS;
AMORPHOUS FILMS;
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EID: 0035928977
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(01)00427-5 Document Type: Article |
Times cited : (13)
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References (30)
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