Langmuir and Langmuir-Blodgett films of amphiphilic hexa-peri-hexabenzocoronene: New phase transitions and electronic properties controlled by pressure

Chemistry - A European Journal

Volumn 7, Issue 22, 2001, Pages 4894-4901

  Reitzel, Niels ^a   Hassenkam, Tue ^a   Balashev, Konstantin ^a   Jensen, Torben R ^b   Howes, Paul B ^b   Kjaer, Kristian ^b   Fechtenkötter, Andreas ^c   Tchebotareva, Natalia ^c   Ito, Shunji ^c   Müllen, Klaus ^c   Bjørnholm, Thomas ^a  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^c MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

Langmuir Blodgett films; Liquid crystals; pi interactions; Self assembly; Structure elucidation

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; CRYSTALLOGRAPHY; ELECTRONIC PROPERTIES; LATTICE CONSTANTS; PHASE TRANSITIONS; PRESSURE EFFECTS; SCATTERING; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION ANALYSIS;

GRAZING INCIDENCE X-RAY DIFFRACTION (GIXD);

LANGMUIR BLODGETT FILMS;

AMPHOPHILE; HEXABENZOCORONENE DERIVATIVE; POLYCYCLIC AROMATIC HYDROCARBON; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; FILM; LIQUID CRYSTAL; PHASE TRANSITION; PRESSURE; STRUCTURE ANALYSIS; SURFACE PROPERTY; SYNTHESIS; X RAY DIFFRACTION;

EID: 0035914641     PISSN: 09476539     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3765(20011119)7:22<4894::AID-CHEM4894>3.0.CO;2-S     Document Type: Article

References (39)

1. J. Mater. Chem. 1999, 9, Special issue on Functionalized Organic Materials for Devices.
2. N. Boden, R. J. Bushby, J. Clements, B. Movaghar, J. Mater. Chem. 1999, 9, 2081.
3. A. M. van de Craats, J. M. Warman, K. Müllen, Y. Geerts, J. D. Brand, Adv. Mater. 1998, 10, 36.
4. P. Herwig, C. W. Kayser, K. Müllen, H. W. Spiess, Adv. Mater. 1996, 8, 510.
5. V. S. Iyer, K. Yoshimura, V. Enkelmann, R. Epsch, J. P. Rabe, K. Müllen, Angew. Chem. 1998, 110, 2843;
6. Angew. Chem. Int. Ed. 1998, 37, 2696.
7. M. Müller, C. Kubel, K. Müllen, Chem. Eur. J. 1998, 4, 2099.
8. F. Morgenroth, A. J. Berresheim, M. Wagner, K. Müllen, Chem. Commun. 1998, 1139.
9. A. M. van de Craats, J. M. Warman, A. Fechtenkotter, J. D. Brand, M. A. Harbison, K. Müllen, Adv. Mater. 1999, 11, 1469.
10. A. F. Thunemann, D. Ruppelt, C. Burger, K. Müllen, J. Mater. Chem. 2000, 10, 1325.
11. A. F. Thuneman, D. Ruppelt, S. Ito, K. Müllen, J. Mater. Chem. 1999, 9, 1055.
12. I. Langmuir, J. Am. Chem. Soc. 1917, 39, 1848.
13. K. B. Blodgett, J. Am. Chem. Soc. 1935, 57, 1007.
14. P. Delhaès, V. M. Yartsev, Electronic and Spectroscopic Properties of Conducting Langmuir-Blodgett Films (Eds: R. J. H. Clark, R. E. Hester), Wiley, 1993, pp. 199-289.
15. N. Reitzel, D. R. Greve, K. Kjaer, P. B. Howes, M. Jayaraman, S. Savoy, R. D. McCullough, J. T. McDevitt, T. Bjoørnholm, J. Am. Chem. Soc. 2000, 122, 5788.
16. T. Bjørnholm, T. Hassenkam, N. Reitzel, J. Mater. Chem. 1999, 9, 1975.
17. M. R. Bryce, M. C. Petty, Nature 1995, 374, 771.
18. M. Vandevyver, J. Chim. Phys. Phys.-Chim. Biol. 1988, 85, 1033.
19. J. Garnaes, N. B. Larsen, T. Bjørnholm, M. Jørgensen, K. Kjaer, J. Als-Nielsen, J. F. Jørgensen, J. A. Zasadzinski, Science 1994, 264, 1301.
20. S. Ito, M. Wehmeier, J. D. Brand, C. Kübel, R. Epsch, J. P. Rabe, K. Müllen, Chem. Eur. J. 2000, 6, 4327.
21. J. Als-Nielsen, D. Jacquemain, K. Kjaer, F. Leveiller, M. Lahav, L. Leiserowitz, Phys. Rep. 1994, 246, 251.
22. J. Als-Nielsen, H. Möhwald in Handbook on Synchrotron Radiation, Vol 4 1991, p. 3.
23. K. Kjaer, Physica B 1994, 198, 100.
24. Langimuir-Blodgett Films (Ed.: G. Roberts), Plenum, New York 1990.
25. I. Langmuir, V. J. Schaefer, J. Am. Chem. Soc. 1938, 60, 1351.
26. M. Nonnenmacher, M. P. O'Boyle, H. K. Wickramasinghe, Appl. Phys. Lett. 1991, 58, 2921.
27. A. J. Berlinsky, J. F. Carolan, Solid State Commun. 1974, 15, 795.
28. A. K. Henning, T. Hochwitz, J. Slinkman, J. Never, S. Hoffmann, P. Kaszuba, C. Daghlian, J. Appl. Phys. 1995, 77, 1888.
29. A. Kikukawa, S. Hosaka, R. Imura, Appl. Phys. Lett. 1995, 66, 3510.
30. A. Chavezpirson, O. Vatel, M. Tanimoto, H. Ando, H. Iwamura, H. Kanbe, Appl. Phys. Lett. 1995, 67, 3069.
31. T. Mizutani, T. Usunami, S. Kishimoto, K. Maezawa, Jpn. J. Appl. Phys. Part 1 1999, 38, 4893.
32. T. Mizutani, T. Usunami, S. Kishimoto, K. Maezawa, Jpn. J. Appl. Phys. Part 2 1999, 38, L767.
33. T. Meoded, R. Shikler, N. Fried, Y. Rosenwaks, Appl. Phys. Lett. 1999, 75, 2435.
34. -19 This calculation of the order of magnitude indicates that the number of electrons is very low. The number of molecules inside the domain is about 212 000. Despite the fact that the film is undoped, the nine holes in the high-pressure phase to be filled by the nine electrons from the low-pressure phase can easily be explained by impurities, corrupted molecules etc.
35. H. O. Jacobs, A. Stemmer, Surf. Interface Anal. 1999, 27, 361.
36. H. O. Jacobs, H. F. Knapp, A. Stemmer, Rev. Sci. Inst. 1999, 70, 1756.
37. H. O. Jacobs, P. Leuchtmann, O. J. Homan, A. Stemmer, J. Appl. Phys. 1998, 84, 1168.
38. H. O. Jacobs, H. F. Knapp, S. Muller, A. Stemmer, Ultramicroscopy 1997, 69, 39.
39. A. Guinier, X-ray Diffraction, Freeman, San Francisco 1963.