SCOPUS 정보 검색 플랫폼

Advanced Materials

Volumn 13, Issue 14, 2001, Pages 1103-1105

Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy

(7) Shi, D X a Song, Y L a Zhu, D B a Zhang, H X a Xie, S S a Pang, S J a Gao, H J a

a INSTITUTE OF PHYSICS (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; MOLECULAR STRUCTURE; POLYMERIZATION; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

ELECTRON ACCEPTORS; ELECTRON DONORS; MOLECULAR RECORDING; NANOMETER SCALE; NITROBENZONITRILE THIN FILMS;

ORGANIC COMPOUNDS;

EID: 0035908554 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/1521-4095(200107)13:14<1103::AID-ADMA1103>3.0.CO;2-B Document Type: Article

Times cited : (34)

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