Nanometer-scale recording on an organic-complex thin film with a scanning tunneling microscope

Applied Physics Letters

Volumn 69, Issue 24, 1996, Pages 3752-3753

  Ma, L P ^a   Song, Y L ^b   Gao, H J ^a   Zhao, W B ^a   Chen, H Y ^b   Xue, Z Q ^b   Pang, S J ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000173345     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117181     Document Type: Article

References (5)

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4. A. Sato, S. Momose, and Y. Tsukamoto, J. Vac. Sci. Technol. B 13, 2832 (1995).
5. H. J. Gao, Z. Q. Xue, K. Z. Wang, Q. D. Wu, and S. J. Pang, Appl. Phys. Lett. 68, 2192 (1996).