Phase transition, ferroelectric, and dielectric properties of layer-structured perovskite CaBi3Ti3O12-δ thin films

Applied Physics Letters

Volumn 79, Issue 3, 2001, Pages 397-399

  Kato, K ^a   Suzuki, K ^a   Nishizawa, K ^a   Miki, T ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; FERROELECTRICITY; FILM PREPARATION; LAYERED MANUFACTURING; PEROVSKITE; PHASE TRANSITIONS; RAPID THERMAL ANNEALING; REMANENCE; SCANNING ELECTRON MICROSCOPY; SPIN COATING; X RAY DIFFRACTION ANALYSIS;

REMANENT POLARIZATION;

FERROELECTRIC THIN FILMS;

EID: 0035898323     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1385195     Document Type: Article

References (18)