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The precise GaAs layer thicknesses for which full and zero correlation of the dot positions occurs will depend upon the dot growth conditions which control the shape, size and density of the dots.
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We note that previous structural studies of closely stacked dots have shown evidence for size variations along the stack (see references 6, 9, and 10) but without an obvious splitting. This observation suggests that the structure of the dots is sensitive to the growth conditions. Evidence in support of this conclusion is provided by cross-sectional scanning tunneling microscopy studies (P. M. Koenraad, private communication) of dots grown in the same reactor as those studied in this article but using a growth rate a factor of 10 lower. In this case a size variation is observed along the stack but without any lateral splitting
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We note that previous structural studies of closely stacked dots have shown evidence for size variations along the stack (see references 6, 9, and 10) but without an obvious splitting. This observation suggests that the structure of the dots is sensitive to the growth conditions. Evidence in support of this conclusion is provided by cross-sectional scanning tunneling microscopy studies (P. M. Koenraad, private communication) of dots grown in the same reactor as those studied in this article but using a growth rate a factor of 10 lower. In this case a size variation is observed along the stack but without any lateral splitting.
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Because the dots have a height significantly less than their width it is fluctuations of the former dimension which make the major contribution to the broadening of the electronic states
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Because the dots have a height significantly less than their width it is fluctuations of the former dimension which make the major contribution to the broadening of the electronic states.
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Results from an eight-band k.p calculation
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Results from an eight-band k.p calculation [O. Steir, M. Grundmann, and D. Bimberg, Phys. Rev. B 59, 5688 (1999)] show that the lowest hole state is predominantly heavy hole in character but contains ∼9% light-hole character (O. Stier private communication).
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Actual tunneling rates are likely to be faster than the calculated values as a result of In diffusion from the dots into the GaAs barriers which will reduce the height of the tunneling barrier. See, for example
-
Actual tunneling rates are likely to be faster than the calculated values as a result of In diffusion from the dots into the GaAs barriers which will reduce the height of the tunneling barrier. See, for example, P. W. Fry, I. E. Itskevich, D. J. Mowbray, M. S. Skolnick, J. J. Finley, J. A. Barker, E. P. O'Reilly, L. R. Wilson, I. A. Larkin, P. A. Maksym, M. Hopkinson, M. Al-Khafaji, J. P. R. David, A. G. Cullis, G. Hill, and J. C. Clark, Phys. Rev. Lett. 84, 733 (2000).
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26
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21944448620
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For the 4 nm GaAs sample the separation between the tip of one dot and the base of the next dot in the stack is only ∼2 nm [see Fig. 2(a)]
-
For the 4 nm GaAs sample the separation between the tip of one dot and the base of the next dot in the stack is only ∼2 nm [see Fig. 2 (a)].
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