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Volumn 40, Issue 1 A/B, 2001, Pages
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Growth of preferentially oriented microcrystalline silicon film using pulse-modulated ultrahigh-frequency plasma
a a a a a a b c
c
Anelva Corporation
*
(Japan)
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Author keywords
H atom density; Preferential orientation; Pulse modulation; UHF PECVD; VUVAS; c Si:H
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Indexed keywords
CRYSTAL GROWTH;
CRYSTAL ORIENTATION;
FILM GROWTH;
GLASS;
HYDROGEN;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SEMICONDUCTOR GROWTH;
SUBSTRATES;
THIN FILMS;
HYDROGEN ATOM DENSITY;
SEMICONDUCTING SILICON;
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EID: 0035862498
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.40.l4 Document Type: Article |
Times cited : (10)
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References (11)
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