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Volumn 34, Issue 15, 2001, Pages
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Structural study and fabrication of nano-pattern on ultra thin film of Ag grown by magnetron sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL MODIFICATION;
FILM GROWTH;
MAGNETRON SPUTTERING;
POROSITY;
SCANNING TUNNELING MICROSCOPY;
SILICON;
SILVER;
SURFACE STRUCTURE;
THICKNESS MEASUREMENT;
GRAZING INCIDENCE X RAY REFLECTIVITY;
NANOPATTERN;
ULTRATHIN FILMS;
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EID: 0035822579
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/34/15/101 Document Type: Article |
Times cited : (6)
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References (18)
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