Study of thin film multilayers using X-ray reflectivity and scanning probe microscopy

Vacuum

Volumn 60, Issue 4, 2001, Pages 371-376

  Banerjee, S ^a   Datta, A ^a   Sanyal, M K ^a  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

Author keywords

Multilayers; Scanning probe microscopy; Thin film; X ray reflectivity

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); SURFACE STRUCTURE; THIN FILMS; X RAY ANALYSIS;

BORN APPROXIMATION; X RAY REFLECTIVITY;

MULTILAYERS;

EID: 0035283451     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0042-207x(00)00146-9     Document Type: Article

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