Chemical force microscopies by friction and adhesion using chemically modified atomic force microscope (AFM) tips

Studies in Surface Science and Catalysis

Volumn 132, Issue , 2001, Pages 469-476

  Fujihira, M ^a   Tani, Y ^a   Furugori, M ^a   Okabe, Y ^a   Akiba, U ^a   Yagi, K ^a   Okamoto, S ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FLUOROCARBON; HYDROCARBON; THIOL DERIVATIVE;

ATOMIC FORCE MICROSCOPY; CHEMICAL FORCE MICROSCOPY; CHEMICAL MODIFICATION; CONFERENCE PAPER; DIPOLE; FILM; FRICTION; MOLECULAR RECOGNITION; PHASE SEPARATION; SURFACE PROPERTY;

EID: 0035787483     PISSN: 01672991     EISSN: None     Source Type: Book Series    
DOI: 10.1016/s0167-2991(01)82133-9     Document Type: Conference Paper

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