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Volumn 4400, Issue , 2001, Pages 115-126

Fully integrated on-chip laboratories for Mems-based material and structure mechanical analysis

Author keywords

Bending fracture; Contact interactions; Electrostatic actuators; Material; Mechanical characterization; Mems; Microactuator loading characteristics; Polysilicon fracture strength; Tensile fracture

Indexed keywords

BENDING (DEFORMATION); CHEMICAL VAPOR DEPOSITION; ELECTROSTATIC ACTUATORS; FRACTURE TOUGHNESS; POLYSILICON; SEMICONDUCTING FILMS;

EID: 0035759019     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.445594     Document Type: Conference Paper
Times cited : (3)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.