Light-hadron induced SER and scaling relations for 16- And 64-Mb DRAMS

IEEE Transactions on Nuclear Science

Volumn 47, Issue , 2000, Pages 403-407

  Hofman, G J ^a   Peterson, R J ^a   Gelderloos, C J ^a   Ristinen, R A ^a   Nelson, M E ^b   Thompson, A ^c   Ziegler, J F ^d   Mullfeld, H ^d  

^a UNIVERSITY OF COLORADO   (United States)

^b UNITED STATES NAVAL ACADEMY   (United States)

^c NATIONAL INSTITUTE OF STANDARDS   (United States)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; MICROPROCESSOR CHIPS; NEUTRONS; PARTICLE BEAMS; PROTONS; RADIATION EFFECTS;

HADRONS; PIONS; SOFT ERROR RATES (SER);

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0033706308     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.846273     Document Type: Article

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