In-flight and ground testing of single event upset sensitivity in static RAMs

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 pt 3, 1998, Pages 1628-1632

  Johansson, Karin ^a   Dyreklev, Peter ^a   Granbom, Bo ^a   Catherine Calvet, M ^a   Fourtine, Stephane ^a   Feuillatre, Odile ^a  

^a SAAB AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

AIRCRAFT; AVIONICS; COSMIC RAYS; ELECTRONIC EQUIPMENT TESTING; FLIGHT DYNAMICS; NEUTRONS; RADIATION EFFECTS; SENSITIVITY ANALYSIS; TEST FACILITIES;

COMPONENT UPSET TEST EQUIPMENT; SINGLE EVENT UPSETS; STATIC RANDOM ACCESS MEMORIES;

RANDOM ACCESS STORAGE;

EID: 0032097194     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.685251     Document Type: Article

References (14)

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