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Volumn 46, Issue 6 PART 1, 1999, Pages 1370-1377

Threshold LET for SEU induced by low energy ions

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; COMPUTER SIMULATION; MATHEMATICAL MODELS; NEUTRONS; PARTICLE BEAM TRACKING; PROTONS;

EID: 0033351823     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819095     Document Type: Article
Times cited : (13)

References (14)
  • 1
    • 84904466214 scopus 로고    scopus 로고
    • 22, 2675 - 2680 (1975).
    • D. Binder, C.E. Smith, and A.B. Holman, «Satellite Anomalies from Galactic Cosmic Rays » IEEE Trans. Nucl. Sei. 22, 2675 - 2680 (1975).
    • Binder, D.1    Smith, C.E.2    Holman, A.B.3
  • 3
    • 0018619487 scopus 로고    scopus 로고
    • 26, 5048 - 5052 (1979).
    • C.S. Guenzer, E.A. Woticki, and R.G. Alias, «Single Event Upset of Dy-namic RAMs by Neutrons and Protons, »IEEE Trans. Nucl. Sei. 26, 5048 - 5052 (1979).
    • Guenzer, C.S.1    Woticki, E.A.2    Alias, R.G.3    Protons4
  • 4
    • 0019679302 scopus 로고    scopus 로고
    • 28,4007 - 4012 (1981).
    • P.J. McNuIty, G.E, Farrell, and W.P. Tucker, «Proton-Induced Nuclear Reactions in Silicon, »IEEE Trans. Nucl. Sei, 28,4007 - 4012 (1981).
    • McNuity, P.J.1    Farrell2    Tucker, W.P.3
  • 5
    • 0020948470 scopus 로고    scopus 로고
    • 30, 4533 - 4539 (1983).
    • E.L. Petersen, J.B. Langworthy, and S.E. Diehl, «Suggested Single Event Upset Figure of Merit, »IEEE Trans. Nucl. Sei. 30, 4533 - 4539 (1983).
    • Petersen, E.L.1    Langworthy, J.B.2    Diehl, S.E.3
  • 6
    • 0029454621 scopus 로고    scopus 로고
    • 3rd European jonference on Radiation and Its Effects on Components and Systems September 18-22 1995, Archachon France, G. Sarrabayrouse, M. Labrunee, and R, Ecoffet, Eds. (IEEE Press, Piscataway , NJ, 1995) pp. 397-401.
    • PJ. McNulty, R.A. Reed, Beauvais, and D.R, Roth, "Shape of the Response Curve in SEU Testing" in Proceedings of the 3rd European jonference on Radiation and Its Effects on Components and Systems September 18-22 1995, Archachon France, G. Sarrabayrouse, M. Labrunee, and R, Ecoffet, Eds. (IEEE Press, Piscataway , NJ, 1995) pp. 397-401.
    • Shape of the Response Curve in SEU Testing in Proceedings of the
    • McNulty, P.J.1    Reed, R.A.2    Beauvais3    Roth4
  • 8
    • 0032313625 scopus 로고    scopus 로고
    • 45, 2745 - 2751 (1998).
    • M.W. Savage, P.J. McNulty, D.R. Roth, and C.C. Foster, «Possible Rôle for Secondary Particles in Single Event Upsets of Modern Devices, »IEEE Trans. Nucl. Sei. 45, 2745 - 2751 (1998).
    • Savage, M.W.1    McNulty, P.J.2    Roth, D.R.3    Foster, C.C.4
  • 12
    • 0020312672 scopus 로고
    • Charge Funneling in n and p type Si Substrates
    • F.B. McLean and T.R. Oldham, "Charge Funneling in n and p type Si Substrates" IEEE Trans. Nucl. Sei. 29 2018-2023 (1982).
    • (1982) IEEE Trans. Nucl. Sei. , vol.29 , pp. 2018-2023
    • McLean, F.B.1    Oldham, T.R.2
  • 14
    • 0026137972 scopus 로고
    • A Simple Estimate of Funneling Assisted Charge Collection
    • L.D. Edmonds, A Simple Estimate of Funneling Assisted Charge Collection" IEEE Trans. Nucl. Sei. 828-833 (1991),
    • (1991) IEEE Trans. Nucl. Sei. , pp. 828-833
    • Edmonds, L.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.