A P1500 compliant BIST-based approach to embedded RAM diagnosis

Proceedings of the Asian Test Symposium

Volumn , Issue , 2001, Pages 97-102

  Appello, D ^a   Corno, F ^b   Giovinetto, M ^b   Rebaudengo, M ^b   Reorda, M Sonza ^b  

^a STMICROELECTRONICS   (Italy)

^b POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; EMBEDDED SYSTEMS; INTERFACES (COMPUTER); MICROCONTROLLERS; RANDOM ACCESS STORAGE; STANDARDS;

EMBEDDED RANDOM ACCESS MEMORY; MARCH ALGORITHM; TEST ACCESS PORT CONTROLLER;

BUILT-IN SELF TEST;

EID: 0035701292     PISSN: 10817735     EISSN: None     Source Type: Journal    
DOI: 10.1109/ATS.2001.990266     Document Type: Article

References (11)

1. Using March tests to test SRAMs
2. Tutorial on semiconductor memory testing
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4. A programmable BIST core for embedded DRAM
5. Diagnostic testing of embedded memories using BIST
6. Error catch and analysis for semiconductor memories using March tests
7. Memory fault diagnosis by syndrome compression
8. Built-in self-repair for embedded high density SRAM
9. Towards a standard for embedded core test: An example