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Volumn 24, Issue 4, 2001, Pages 691-697
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Electroless Ni-Cu-P barrier between Si/Ti/Al pad and Sn-Pb flip-chip solder bumps
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Author keywords
Diffusion barrier; Electroless nickel; Flip chip; Intermetallic; Solder bump
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Indexed keywords
CRYSTALLIZATION;
DIFFUSION;
ELECTROLESS PLATING;
INTERMETALLICS;
NICKEL COMPOUNDS;
SOLDERING ALLOYS;
SURFACE CHEMISTRY;
TIN ALLOYS;
DIFFUSION BARRIERS;
FLIP CHIP DEVICES;
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EID: 0035696899
PISSN: 15213331
EISSN: None
Source Type: Journal
DOI: 10.1109/6144.974962 Document Type: Article |
Times cited : (13)
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References (32)
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