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Volumn 24, Issue 4, 2001, Pages 691-697

Electroless Ni-Cu-P barrier between Si/Ti/Al pad and Sn-Pb flip-chip solder bumps

Author keywords

Diffusion barrier; Electroless nickel; Flip chip; Intermetallic; Solder bump

Indexed keywords

CRYSTALLIZATION; DIFFUSION; ELECTROLESS PLATING; INTERMETALLICS; NICKEL COMPOUNDS; SOLDERING ALLOYS; SURFACE CHEMISTRY; TIN ALLOYS;

EID: 0035696899     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/6144.974962     Document Type: Article
Times cited : (13)

References (32)
  • 5
    • 0000024967 scopus 로고    scopus 로고
    • Morphology of wetting reaction of eutectic SnPb Solder on Au foils
    • (1996) J. Appl. Phys. , vol.80 , Issue.7 , pp. 3822-3827
  • 19
    • 0028482091 scopus 로고
    • Solderability of electroless nickel alloys using wetting balance technique
    • (1994) Jpn. J. Appl. Phys. - Part 1 , vol.33 , Issue.8 , pp. 4708-4713
  • 27
    • 0034248629 scopus 로고    scopus 로고
    • The reactions between electroless Ni-Cu-P deposit and 63Sn-37Pb flip chip solder bumps during reflow
    • (2000) J. Electron. Mater. , vol.29 , Issue.8 , pp. 1007-1014
  • 30
    • 0028374970 scopus 로고
    • Ni-Cu-P and Ni-Co-P as a diffusion barrier between an Al pad and a solder hump
    • (1994) Thin Solid Films , vol.239 , Issue.1 , pp. 93-98


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.