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Volumn 7, Issue 6, 1996, Pages 397-401

The interactions between In-Sn solders and an electroless Ni-P deposit upon heat treatment

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSION IN SOLIDS; HEAT TREATMENT; INDIUM ALLOYS; INTERMETALLICS; NICKEL ALLOYS; SOLDERING ALLOYS; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

EID: 0030382894     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00180776     Document Type: Article
Times cited : (20)

References (22)
  • 19
    • 0021655598 scopus 로고
    • edited by A D Romig and J I Goldstein San Francisco Press, San Francisco
    • A D ROMIG Jr. F G YOST and P F HLAVA, in "Microbeam Analysis", edited by A D Romig and J I Goldstein (San Francisco Press, San Francisco, 1984) p 87
    • (1984) Microbeam Analysis , pp. 87
    • Romig Jr., A.D.1    Yost, F.G.2    Hlava, P.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.