Test methodology for the McKinley processor

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 578-585

  Josephson, Don Douglas ^a   Poehlman, Steve ^a   Govan, Vincent ^a   Mumford, Clint ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT TESTING; LOGIC DESIGN; PHASE LOCKED LOOPS; PROGRAM DEBUGGING; TIMING CIRCUITS;

MCKINLEY PROCESSORS; MEMORY ARRAYS;

MICROPROCESSOR CHIPS;

EID: 0035684216     PISSN: 10893539     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2001.966676     Document Type: Article

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