Determination of the orientation in small areas of the exit wave

Ultramicroscopy

Volumn 87, Issue 1-2, 2001, Pages 89-96

  Bokel, R M J ^a   Jansen, J ^a   Zandbergen, H W ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Electron microscope design and characterisation; Exit wave reconstruction; High resolution transmission electron microscopy

Indexed keywords

ALGORITHM; ARTICLE; COMPUTER PROGRAM; DIFFRACTION; ELECTRON DIFFRACTION; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035107029     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00056-5     Document Type: Article

References (14)