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Volumn 48, Issue 1, 1999, Pages 35-37

Evaluation of image drift correction by three-dimensional Fourier analysis

Author keywords

Cross correlation function; Fourier analysis; Image drift correction; Three dimensional power spectrum; Through focus series; Transmission electron microscope

Indexed keywords

FOURIER SERIES; FUNCTION EVALUATION; IMAGE ANALYSIS; POWER SPECTRUM; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032991196     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023648     Document Type: Article
Times cited : (7)

References (4)
  • 1
    • 0024951939 scopus 로고
    • Image restoration in coherent imaging system involving spherical aberration
    • Ikuta T (1989) Image restoration in coherent imaging system involving spherical aberration. J. Electron. Microsc. 38: 415-422.
    • (1989) J. Electron. Microsc. , vol.38 , pp. 415-422
    • Ikuta, T.1
  • 2
  • 3
    • 0031378518 scopus 로고    scopus 로고
    • High-resolution spherical-aberration-free phase imaging by defocus image modulation processing under hollow-cone illumination: Experimental confirmation by optical microscopy
    • Utsuro H, Ando T, Takai Y, Shimizu R, and Ikuta T (1997) High-resolution spherical-aberration-free phase imaging by defocus image modulation processing under hollow-cone illumination: experimental confirmation by optical microscopy. Optik 107: 67-72.
    • (1997) Optik , vol.107 , pp. 67-72
    • Utsuro, H.1    Ando, T.2    Takai, Y.3    Shimizu, R.4    Ikuta, T.5
  • 4
    • 0002588298 scopus 로고
    • Assessment of image formation by three-dimensional power spectrum in transmission electron microscopy
    • Taniguchi Y, Ikuta T, and Shimizu R (1991) Assessment of image formation by three-dimensional power spectrum in transmission electron microscopy. J. Electron. Microsc. 40: 5-10.
    • (1991) J. Electron. Microsc. , vol.40 , pp. 5-10
    • Taniguchi, Y.1    Ikuta, T.2    Shimizu, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.