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Volumn 39, Issue 1, 2001, Pages 184-188

Fatigue and Data Retention Characteristics of Single-Grained Pb(Zr,Ti)O3 Thin Films

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[No Author keywords available]

Indexed keywords


EID: 0035628475     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (15)

References (15)
  • 14
    • 0003679027 scopus 로고
    • McGraw-Hill, Singapore, Chap. 14
    • S. M. Sze, VLSI Technology (McGraw-Hill, Singapore, 1988), Chap. 14.
    • (1988) VLSI Technology
    • Sze, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.