SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 654, Issue , 2001, Pages

The origin of electrical activity at grain boundaries in perovskites and related materials

(6) Pennycook, S J a Kim, M a Duscher, G a Browning, N D a Sohlberg, K a Pantelides, S T a

a OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; GRAIN BOUNDARIES; HIGH TEMPERATURE SUPERCONDUCTORS; STOICHIOMETRY; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION CONTRAST MICROSCOPY; ELECTRICAL ACTIVITY ORIGIN; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

PEROVSKITE;

EID: 0035558953 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (1)

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