Z-contrast imaging of grain-boundary core structures in semiconductors

MRS Bulletin

Volumn 22, Issue 8, 1997, Pages 53-57

  Chisholm, M F ^a   Pennycook, S J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; ELECTRON MICROSCOPY; ELECTRONIC STRUCTURE; IMAGING TECHNIQUES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE STRUCTURES;

TILT BOUNDARIES; Z CONTRAST TECHNIQUE;

GRAIN BOUNDARIES;

EID: 0031213334     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400033820     Document Type: Article

References (21)

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