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Volumn 670, Issue , 2001, Pages K411-K4110
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Chemical vapor deposition of titania/silica and zirconia films
a a a a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS FILMS;
CHEMICAL VAPOR DEPOSITION;
COMPOSITION;
ELLIPSOMETRY;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SILICA;
SUBSTRATES;
SURFACES;
THIN FILMS;
TITANIUM COMPOUNDS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
X RAYS;
ZIRCONIA FILMS;
ZIRCONIA;
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EID: 0035557331
PISSN: 02729172
EISSN: None
Source Type: Journal
DOI: 10.1557/proc-670-k4.1 Document Type: Article |
Times cited : (2)
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References (26)
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