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Volumn 10, Issue 9-10, 2001, Pages 1910-1915
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Characteristics of Si-C-N films deposited by microwave plasma CVD on Si wafers with various buffer layer materials
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Author keywords
Buffer layer; Cathodoluminescence; Field emission; Silicon carbon nitride
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Indexed keywords
CARBON;
CATHODOLUMINESCENCE;
CHEMICAL VAPOR DEPOSITION;
COLUMNS (STRUCTURAL);
CRYSTAL STRUCTURE;
MORPHOLOGY;
NITROGEN;
SILICON;
SPECTROSCOPY;
SYNTHESIS (CHEMICAL);
TITANIUM;
BUFFER LAYER MATERIALS;
THIN FILMS;
SILICON CARBON NITRIDE;
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EID: 0035448843
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-9635(01)00440-X Document Type: Article |
Times cited : (37)
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References (22)
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