Co interaction with clean silicon surfaces

Surface Science

Volumn 373, Issue 1, 1997, Pages 43-55

  Dolbak, A E ^a   Olshanetsky, B Z ^a   Teys, S A ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

Auger electron spectroscopy; Cobalt; Low energy electron diffraction; Low index single crystal surfaces; Semiconducting surfaces; Silicon; Surface diffusion; Surface structure

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; DIFFUSION; LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; SILICON; SURFACE STRUCTURE; SURFACES;

SOLID PHASE EPITAXY; SURFACE DIFFUSION;

COBALT;

EID: 0031076847     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01150-8     Document Type: Article

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