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Volumn 10, Issue 3, 2001, Pages 327-335

Comparison of capacitive and feedback-interferometric measurements on MEMS

Author keywords

Mechanical variables measurement; Microelectromechanical systems (MEMS); Micromachining; Microsensors; Optical interferometry

Indexed keywords

FEEDBACK INTERFEROMETRY; MICRORESONATOR;

EID: 0035441451     PISSN: 10577157     EISSN: None     Source Type: Journal    
DOI: 10.1109/84.946778     Document Type: Article
Times cited : (23)

References (21)
  • 1
    • 0002982341 scopus 로고    scopus 로고
    • Design, test, integration and packaging of MEMS/MOEMS
    • B. Courtois et al., Ed.
    • SPIE Proc., 2000 , vol.4019 , pp. 344-398


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.