Feedback interferometry with semiconductor laser for high resolution displacement sensing

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2783, Issue , 1996, Pages 203-210

  Donati, Silvano ^a   Merlo, Sabina ^a   Micolano, Francesco ^a  

^a UNIVERSITY OF PAVIA   (Italy)

Author keywords

Feedback interferometry; Semiconductor laser; Speckle pattern; Visible laser diode

Indexed keywords

FEEDBACK; INTERFEROMETRY; MICROSYSTEMS; OPTICAL INSTRUMENTS; SPECKLE;

DIRECTIONAL DISCRIMINATION; DISPLACEMENT SENSING; ELECTRONIC UNITS; INDUSTRIAL ENVIRONMENTS; OPTICAL CONFIGURATIONS; RED EMITTING LASERS; SPECKLE PATTERNS; VISIBLE LASER DIODES;

SEMICONDUCTOR LASERS;

EID: 0000506147     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.248490     Document Type: Conference Paper

References (4)

1. S. Donati, G. Giuliani, S. Merlo "Laser diode feedback interferometer for measurements of displacement without ambiguity", IEEE Journal of Quantum Electronics, Vol. 31, No. 1, pp. 113-119, 1995.
2. S. Donati, L. Falzoni, S. Merlo, paper submitted to IEEE Transactions on Instrumentation and Measurement.
3. J. W. Goodman, "Statistical properties of laser speckle pattern", in Laser Speckle and Related Phenomena, Topics in Applied Phys., J. C. Dainty Ed., Vol. 9, pp. 9-75, Springer-Verlag, Berlin, 1975.
4. S. Donati, G. Martini, "Speckle-pattern intensity and phase: Second-order conditional statistics", J. Opt. Soc. Am., Vol. 69, No. 12, pp. 1690-1694, 1979.