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Volumn 289, Issue 1-3, 2001, Pages 168-174
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Effect of oxygen contamination on the properties of the silicon hydrogen alloy materials deposited under conditions near the microcrystalline silicon formation region
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS FILMS;
CHEMICAL BONDS;
CONTAMINATION;
CRYSTAL GROWTH;
GRAIN GROWTH;
OXYGEN;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SILANES;
ULTRAHIGH VACUUM;
MONOCRYSTALLINE SILICON FILMS;
SILICON ALLOYS;
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EID: 0035421595
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3093(01)00723-2 Document Type: Article |
Times cited : (10)
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References (20)
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