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Volumn 289, Issue 1-3, 2001, Pages 168-174

Effect of oxygen contamination on the properties of the silicon hydrogen alloy materials deposited under conditions near the microcrystalline silicon formation region

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHEMICAL BONDS; CONTAMINATION; CRYSTAL GROWTH; GRAIN GROWTH; OXYGEN; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILANES; ULTRAHIGH VACUUM;

EID: 0035421595     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(01)00723-2     Document Type: Article
Times cited : (10)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.