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Superconductor Science and Technology

Volumn 14, Issue 6, 2001, Pages 346-352

Effect of flux creep on Ic measurement of electric transport

(4) Zhang, Y H a,b Luo, H a Wu, X F a Ding, S Y a

a NANJING UNIVERSITY (China)

b TONGJI UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC POTENTIAL; HIGH TEMPERATURE EFFECTS; INDUCED CURRENTS; VOLTMETERS;

FLUX CREEP EQUATIONS; SWEEPING RATES;

MAGNETIC FLUX;

EID: 0035365583 PISSN: 09532048 EISSN: None Source Type: Journal
DOI: 10.1088/0953-2048/14/6/308 Document Type: Article

Times cited : (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.