Resistance relaxation resulting from current diffusion in superconducting thin films

Physica C: Superconductivity and its Applications

Volumn 291, Issue 3-4, 1997, Pages 229-234

  Zeng, Z Y ^a   Yao, X X ^a   Qin, M J ^a   Ge, Y ^a   Ren, C ^a   Ding, S Y ^a   Ma, L P ^b   Li, H C ^b   Li, L ^b  

^a NANJING UNIVERSITY   (China)

^b INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRIC CURRENT DISTRIBUTION; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; ELECTRODYNAMICS; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; OXIDE SUPERCONDUCTORS; RELAXATION PROCESSES; THIN FILMS;

CURRENT DIFFUSION; TRANSPORT MEASUREMENT;

SUPERCONDUCTING FILMS;

EID: 0031333075     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(97)01654-7     Document Type: Article

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